Free download Handbook of Microscopy Applications in Materials Science, Solid-state Physics and Chemistry by S Amelinckx

Authors of:  Handbook of Microscopy Applications in Materials Science, Solid-state Physics and Chemistry by S Amelinckx

S Amelinckx

Dirk van Dyck

J van Landuyt

Gustaaf van Tendeloo 

Table of Contents in Handbook of Microscopy Applications in Materials Science, Solid-state Physics and Chemistry by S Amelinckx

Volume 1: Methods I

I Light Microscopy

1 Fundamentals of Light Microscopy

E Miicklich

2 Optical Contrasting of Microstructures

E Mucklich

3 Raman Microscopy

P. Dhamelincourt, J. Barbillat

4 Three-Dimensional Light Microscopy

E. H. K. Stelzer

5 Near Field Optical Microscopy

D. Courjon, M. Spajer

6 Infrared Microscopy

J. P. Huvenne. B. Sombret

I1 X-Ray Microscopy

1 Soft X-Ray Imaging

G. Schmahl

2 X-Ray Microradiography

D. Mouze

3 X-Ray Microtomography

J. Cazaux

4 Soft X-Ray Microscopy by Holography

D. Joyeux

5 X-Ray Diffraction Topography

M. Schlenker, J. Baruchel

I11 Acoustic Microscopy

1 Acoustic Microscopy

A. Bviggs

X Outline

IV Electron Microscopy

Stationary Beam Methods

Transmission Electron Microscopy

Diffraction Contrast Transmission Electron Microscopy

S. Amelinckx

High-Resolution Electron Microscopy

D. Van Dyck

Reflection Electron Microscopy

J. M. Cowley

Electron Energy-Loss Spectroscopy Imaging

C. Colliex

High Voltage Electron Microscopy

H. Fujita

Convergent Beam Electron Diffraction

D. Cherns, J. W. Steeds, R. Vincent

Low-Energy Electron Microscopy

E. Bauer

Lorentz Microscopy

J. P. Jakubovics

Electron Holography Methods

H. Lichte

Volume 2: Methods I1

IV Electron Microscopy

2 Scanning Beam Methods

2.1 Scanning Reflection Electron Microscopy

2.2 Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy: 2 Contrast

S. J. Pennycook

Scanning Auger Microscopy (SAM) and Imaging X-Ray

Photoelectron Microscopy (XPS)

R. De Gryse, L. Fiermans

R. Gijbels

Imaging Secondary Ion Mass Spectrometry

P. van Espen, G. Janssens

2.5 Scanning Microanalysis

Magnetic Methods

1 Nuclear Magnetic Resonance

D. G. Cory, S. Choi

2 Scanning Electron Microscopy with Polarization Analysis

J. Unguris, M. H. Kelley, A. Gavrin, R. J. Celotta,

D. T. Pierce, M. R. Scheinfein

3 Spin-Polarized Low-Energy Electron Microscopy

Emission Methods

1 Photoelectron Emission Microscopy

M. Mundschau

Field Emission and Field Ion Microscopy (Including Atom

Probe FIM)

A. Cerezo, G. D. W. Smith

Scanning Point Probe Techniques

General Introduction

1 Scanning Tunneling Microscopy

R. Wiesendanger

2 Scanning Force Microscopy

U. D. Schwarz

3 Magnetic Force Microscopy

A. Wadas

4 Ballistic Electron Emission Microscopy

J. DiNardo

Image Recording, Handling and Processing

1 Image Recording in Microscopy

K. -H. Herrmann

2 Image Processing

N. Bonnet

Special Topics

1 Coincidence Microscopy

P. Kruit

XI1 Outline

2 Low Energy Electron Holography and Point-Projection

Microscopy

J. C. H. Spence

Volume 3: Applications

I Classes of Materials

Metals and Alloys

J. Th. M. De Hosson

G. van Tendeloo

Microscopy of Rocks and Minerals

D. J. Barber

Semiconductors and Semiconducting Devices

H. Oppolzer

Optoelectronic Materials

I. Berbezier, J. Derrien

Domain Structures in Ferroic Materials

E. K. H. Salje

Structural Ceramics

M. Ruhle

Microscopy of Gemmological Materials

J. van Landuyt, M. H. G. van Bockstael, J. van Royen

Superconducting Ceramics

G. van Tendeloo

Non-Periodic Structures

High-Resolution Imaging of Amorphous Materials

P. H. Gaskell

Quasi-Crystalline Structures

K. H. Kuo

Medical and Dental Materials

K. Yasuda, K. Hisatsune, H. Takahashi, K.-I. Udoh, Y. Tanaka

Carbon

D. Bernaerts and S. Amelinckx

Composite Structural Materials

0. Van der Biest, P. Lust, K. Lambrinou, J. Ivens, I. Verpoest,

L. Froyen

The Structure of Polymers and Their Monomeric Analogs

I. G. Voigt-Martin

Outline XI11

14 Nuclear Materials

15 Magnetic Microscopy

H. Blank, Hj. Matzke, H. Mauflner, I. L. E Ray

A. Hubert

I1 Special Topics

1 Small Particles

(Catalysis, Photography, Magnetic Recording)

H. W. Zandbergen, C. Trceholt

2 Structural Phase Transformations

H. Warlimont

3 Preparation Techniques

for Transmission Electron Microscopy

A. Barna, G. Radndczi, B. Pe’cz

W. Jambers, R. E. Van Grieken

The Determination of Quantitative Data From Micrographs

P. J. Goodhew

4 Environmental Problems

5 Quantitative Hyleography:

Volume 3: Applications

General Introduction 1

I Classes of Materials  

Metals and Alloys 5

J. Th. M. De Hosson

Imaging Metals and Alloys: Introduction 5

Apparatus and Techniques for Imaging Metallic Systems 8

Metallic Specimen Preparation for Transmission Electron

Microscopy 12

Electrochemical Thinning 12

Ion Milling 13

Typical Examples 14

Observations of Static Dislocations by Transmission Electron

Microscopy 14

Atomic Peening 15

Stress Fields in the Implanted Layer 18

Micro-Preening 22

Dynamic Transmission Electron Microscopy Observations :

In-Situ Deformation 40

Grain Boundary Structures 42

TEM Holder for Straining at Temperature 47

In-situ Deformation Results 49

High-Resolution Transmission Electron Microscopy 71

Imaging Metals and Alloys : Conclusions 77

Imaging Phase Transformations in Metals and Alloys 80

G. van Tendeloo, D. Schryvers

General Introduction 80

Diffusive Phase Transformations in Alloys 81

Long Range Ordered Alloys 84

Short Range Order and Initial Stages of Ordering in

Dla-Type Alloys 86

Interface Wetting in Ordered Alloys 89

Displacive Transformations in Metals and Alloys 92

Microstructures 92

Internal and Atomic Structure 94

Interfaces, Defects and Precipitates 96

Precursor Phenomena 97

Nucleation and Transformation Characteristics 99

Some Other Transformations in Alloys 100

Imaging Phase Transformations : Conclusions 103

References 104

Microscopy of Rocks and Minerals 111

D. J. Barber

Introduction 111

Optical Microscopy, Petrology, and Other Optical

Methods 111

Transmitted Light Microscopy and Petrology 111

Reflected Light Microscopy and Opaque Minerals 114

Infrared Micro-spectroscopy, Laser Raman Microprobe and

Micro-Raman Imaging 114

Phase Identification 114

Fluid Inclusions 115

Confocal Scanning Laser Microscopy 116

Ultraviolet Fluorescence Optical Microscopy 116

X-Ray Methods 117

Computer-Aided Tomography 117

X-Ray Microtopography 117

Scanning Acoustic Microscopy 118

Cathodoluminescence Microscopy 118

Scanning Electron Microscopy 120

General Uses 120

Electron Channeling Patterns 123

Electron Backscattering Patterns 123

Microanalysis by Scanning Electron Microscopy and Electron

Probe Microanalysis 124

Transmission Electron Microscopy 125

General Uses 125

Exsolution, Microstructures, Transformations, and Atomic

Structures 127

Phyllosilicates 129

Deformation Mechanisms in Minerals and Rocks 131

Electron Microscopy of Extraterrestrial Minerals

andRocks 133

Contents XVII

2.9 Electron Microscopy of Biogenic Minerals 135

2.10 Auger Electron Spectroscopy (AES) and X-Ray Photoelectron

Spectroscopy (XPS) 136

2.11 Ion Microprobe Analysis and Ion Microscopy 137

2.12 The Scanning Proton Microprobe and Micro-Proton-Induced

X-Ray Emission Spectroscopy 137

2.13 Scanning Tunneling Microscopy and Atomic Force

Microscopy 139

Semiconductors and Semiconducting Devices 145

H. Oppolzer, H. Cerva

Introduction 145

Semiconductor Bulk Material 148

Silicon for Device Fabrication 148

Compound Semiconductros 151

Silicon Technology Processes 153

Dielectric Layers 153

Polysilicon and Metallizations 158

Polysilicon 159

Refractory Metal Silicides 161

Aluminium Metallization 164

Lithography and Etching 167

Doping 169

Process-Induced Defects 174

Thermal Stresses

Metal Precipitates

Stress Fields Induced by Film Edges and Silicon Trenches

Damage Produced by Ion Implantation and Reactive Ion

Etching

Silicon Device Structure

In-Line Wafer Assessment by Scanning Electron

Microscopy

Failure Analysis

Localization of Failure Sites

Physical Failure Analysis

Compound Semiconductor Devices

Heteroepitaxial Layer Structures

(2001 Dark Field Imaging of Thin Cross-sections

Imaging of Cleaved Wedge Specimens

High-Resolution Imaging

High-Resolution Chemical Analysis

3.5.2 Electronic Gallium Arsenide Device Structures

Index

File Size: 44.3 MB. Pages: 1964 Please read Disclaimer.

Free download Handbook of Microscopy Applications in Materials Science, Solid-state Physics and Chemistry by S Amelinckx

Download Link

You may also like to download “Analytical Chemistry by G.D. Christian 7th Edition”.

Free download hundreds of chemistry books in pdf from HERE.

Please Subscribe to our Email list and get notified of our latest uploads (Books, documents) and new updates. Email Subscription Box is provided on the sidebar (for PC) and on the bottom of this post (for Android Devices).

Kindly Like, Follow, and Share our social media pages so that the maximum number of people can benefit from this public service!

Facebook   Instagram    LinkedIn    Twitter    Pinterest

P.S: If the download link(s) is/are not working, kindly drop a comment below, so we’ll update the download link for you.

Happy reading!